Spherulitic microstructure of thin PZT films

Authors

DOI:

https://doi.org/10.33910/2687-153X-2023-4-2-81-87

Keywords:

PZT thin films, spherulitic microstructure, optical second harmonic generation, mechanical stresses, induced polarization

Abstract

The paper shows that the formation of a radiant spherulites microstructure in lead zirconate-titanate thin films obtained by radio-frequency magnetron sputtering is associated with the formation of radial tensile mechanical stresses acting in the substrate plane, the magnitude of which increases with increasing linear size of spherulites. It leads to a change in the lattice parameter of the perovskite structure and the appearance of induced polarization, the value of which can significantly exceed the spontaneous polarization.

References

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Published

09.06.2023

Issue

Section

Physics of Semiconductors