Piezoelectric properties of spherulite thin films of lead zirconate titanate

Authors

DOI:

https://doi.org/10.33910/2687-153X-2024-5-2-60-66

Keywords:

Piezoelectric force microscopy, lead zirconate titanate thin films, radial-radiant spherulitic microstructure, mechanical stresses, surface potential

Abstract

We studied thin films of lead zirconate titanate, characterized by a spherulitic radial-radiant microstructure, the composition of which corresponds to the region of the morphotropic phase boundary, using the piezoelectric response force microscopy method. Features of the vertical and lateral piezoresponses and the surface potential (Kelvin mode) were revealed. We also compared the piezoelectric response with the radial microstructure features and mechanical stresses formed in the films as a result of crystallization of the perovskite phase from the amorphous phase.

References

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Published

24.06.2024

Issue

Vol. 5 No. 2 (2024)

Section

Condensed Matter Physics

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Copyright (c) 2024 Stanislav V. Senkevich, Dmitry A. Kiselev, Mikhail V. Staritsyn, Evgeny Yu. Kaptelov, Igor P. Pronin

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