Analysis of the local structure of the nearest environment of germanium atoms in chalcogenide alloys Ge2Sb2Te5 using the Mössbauer spectroscopy method

Authors

DOI:

https://doi.org/10.33910/2687-153X-2025-6-3-139-143

Keywords:

Mössbauer spectroscopy, Ge2Sb2Te5, local environment of Ge, magnetron sputtering, X-ray fluorescence analysis

Abstract

The tetrahedral symmetry of the local environment of germanium atoms in amorphous Ge2Sb2Te5
films has been demonstrated by Mössbauer spectroscopy in a 73Ge isotope. We conclude that there
is a significant difference in the immediate environment and, consequently, in the electronic structures
of Ge atoms in crystalline and amorphous Ge2Sb2Te5 films. X-ray amorphous Ge2Sb2Te5 films with a thickness
of 20 μm were obtained by magnetron sputtering of synthesized polycrystalline samples at direct current
in a nitrogen atmosphere onto aluminum foil substrates. The films were then annealed in the temperature
range of 150–200 °C to obtain polycrystalline samples. The composition of the films was controlled by X-ray
fluorescence analysis.

References

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Published

27.10.2025

Issue

Section

Physics of Semiconductors